The technical program for IEEE AUTOTESTCON 2008 will be determined by the interests of those participants who submit papers for publication and those who organize a technical session for an appropriate topic dealing with System Readiness, in general, and Automatic Test Technology, in particular.  In keeping with our conference theme “Surpassing the Limits-Forging Ahead” our focus will be on new ideas and concepts, unusual testing solutions, and future technologies. 

CALL FOR PAPERS

DESCRIPTION OF SEMINARS PROGRAM – Monday Sept. 8th

TECHNICAL PROGRAM OVERVIEW – Tuesday, Sept. 9th  through  Thursday Sept. 11th

Authors/participants of IEEE AUTOTESTCON 2008 should submit for publication and presentation a high quality technical paper, or organize a technical session oriented toward an appropriate topic. 

Abstracts for Technical Papers should be approximately 300 words or one page in length, highlight the main features of the proposed paper (previously unpublished) and deal with one or more of the topics listed above.  Session proposals should include proposed papers/presentations and speakers. 

Automatic Test Technology includes all the important aspects of System Readiness consisting of:

  1. Automatic Test Systems
  2. Verification
  3. Diagnostics
  4. Technology Trends
  5. Software Methods
  6. Tools and Techniques
  7. Logistics
  8. Management
  9. Instrumentation

IEEE AUTOTESTCON 2008 will conduct a student paper awards program for both graduate and undergraduate student papers within the topic scope. There will be cash awards of $500 for best papers in both categories, plus travel subsidies ranging from $300 to $1000 depending on student location.

We are inviting authors to participate in the AUTOTESTCON 2008 Special Issue of IEEE Transactions on Instrumentation and Measurement, intended to promote best results presented at AUTOTESTCON 2008. All accepted authors who presented a paper at AUTOTESTCON 2008 are invited to participate by submitting an extended paper. For instructions on submitting an extended paper refer to the AUTHORS KIT web-page.

For Technical Program information, contact Larry V. Kirkland at or via phone at (801) 451-9191 x124