Thanks for attending IEEE AUTOTESTCON 2009!

Another IEEE AUTOTESTCON has been successfully completed - The 45th edition – and we must say Thanks to the exhibitors, the attendees, the Disneyland Hotel staff, and the organizing Committee, and everyone else that helped make this AUTOTESTCON a successful activity.

To Attendees, we hope that you obtained the kind of advance technical information on automated test systems that you were seeking, and that your role in the field of ATE has been enhanced via your participation. We hope that you were able to visit the vendors in the exhibit halls and take advantage of the tremendous advancements in ATE and TPS technology that they offer to the community.

We also hope that you enjoyed the social activities that we provided to enhance your overall IEEE AUTOTESTCON experience at the Disneyland Resort & Conference Center.

An after-conference CD containing the presentations and a selection of conference photos is in preparation and will be mailed shortly to all registered attendees.

If you have any feedback for us for future consideration or enhancements of this Conference, please provide your feedback This e-mail address is being protected from spambots. You need JavaScript enabled to view it .

To our Exhibitors, we hope that you also enjoyed the Conference and found the venue to be suitable for the furtherance of your business objectives. We would enjoy any feedback or suggestions that you have to offer for future AUTOTESTCONs, please provide your feedback This e-mail address is being protected from spambots. You need JavaScript enabled to view it .

The presentations given during the Plenary session are available here.

The Best Paper awards for this years AUTOTESTCON are as follows:

David M. Goodman Award for the outstanding Management Paper:
Mark Zachos, Dearborn Group, Inc., US
Vehicle Embedded Health Monitoring and Diagnostic System

Walter E. Peterson Award for the best Technical Paper
Anthony Estrada, BAE Systems, US
Proper Frequency Planning in a Synthetic Instrument RF System

Best Undergraduate Student Paper
Andrew Flanyak, Rowan University
Design-For-Testability On A Small Scale

Best Graduate Student Paper
Mikhail Itskovich, University of Maryland
Area Efficient Vector Multiplication for IDDT Test Calibration

Best Graduate Student Paper Runner-up
Anton Pirker-Fruhauf, University of Technics, Vienna, AT
A knowledge-based test program following the ATML Standard

And the Frank McGinnis Professional Achievement Award in Automated Test went to
Les Orlidge, Textron/AAI Corp, Hunt Valley, MD

We hope to see you at IEEE AUTOTESTCON 2010, Orlando Florida, September13-17, Marriott Orlando World Center

Bob Rassa, General Chair,
IEEE AUTOTESTCON 2009